N° de modèle : eobasuv

i1Basic Pro UVcut

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Upgrade Comparison

Ouverture Measurement aperture: 4.5 mm (0.18”) diameter (effective measurement aperture during scanning is depending on the patch size and measurement speed) 
Espace disque disponible 2GB
Étalonnage Manual on external ceramic white reference (included)
Interface de communication USB 1.1
Connectivité Powered USB port
Dimensions (longueur, largeur, hauteur) i1Pro device: 162 mm x 69 mm x 64 mm (6.4” x 2.7” x 2.5”)
Résolution d'affichage 1024x768 pixels or higher
Niveau d'expérience Intermediate to Advanced
Humidité 30 to 85% RH (non-condensing)
Taille du point d'éclairage 3 mm (0.12”)
Accord inter-instrument 0.3 ∆E00* average, 0.8 ∆E00* max. (deviation from X-Rite manufacturing standard at a temperature of 23ºC (73.4ºF) on 12 BCRA tiles (D50, 2º))
Connexion Internet Required for software install, download and automatic update
Langues prises en charge Chinese (Simplified), English, French, German, Italian, Japanese, Korean, Portuguese, Spanish
Source lumineuse i1Pro3 Plus LED Illumination (including UV)
Macintosh MacOS X 10.11x, 10.12x, 10.13x, 10.15 (with latest upgrades installed)
Conditions de mesure • M0 - UV included - ISO 13655:2017
• M1 - D50 - ISO 13655:2017 
• M2 - UV excluded Filter - ISO 13655:2017
Fréquence de mesure en mode de scanning 400 measurements per second
Géométrie de mesure 45°/0° ring illumination optics, ISO 13655:2017
Media Thickness 1mm or less
Mémoire 2GB Minimum
Nombre d'écrans pris en charge par station de travail Up to 4
Plage des températures de service 10°C to 35°C
50°F to 95°F
Taille des patchs Minimal Patch Size in Scanning Mode: 7 x 7  mm (0.28” x 0.28”) (Width x Height) with sensor ruler 10 x 7 mm (0.40” x 0.28”) (Width x Height) without sensor ruler
Gamme photométrique 10nm; Sampling interval 3.5nm
Processeur MAC: Intel® Core 2 Duo CPU or better; WINDOWS: Intel® Core 2 Duo or AMD Athlon™ XP or better
Longueur de scanning Maximum 260mm (10.24")
Prise en charge des mires de scanner Yes
Capacité de scanning Yes
Sécurité User must have Administrator rights to install and uninstall the application
Répétabilité à court terme - Blanc 0.05 dE00 on white (D50,2°, mean of 10 measurements every 3 seconds on white)
Scanning en un seul passage Yes
Kit de développement logiciel Available for OEM customers
Modes logiciels Basic & Advanced
Analyseur spectral i1® technology with built-in wavelengths check; Holographic diffraction grating with 128-pixel diode array
Plage spectrale 380 - 730 nm
Rapport spectral 380 ... 730 nm in 10 nm steps
 
Plage des températures de stockage -20° to 50°C
-4° to 122°F
Format de profil pris en charge ICC version 2, version 4.3,  & iccMax
Unité de couleur Black/Silver
Expérience utilisateur Choose between a ‘basic’, wizard-driven interface or an ‘advanced’, user-driven interface for highest level professional results
Carte vidéo

MAC: Latest drivers for video card installed;

WINDOWS: Latest drivers for video card installed, dual display support requires either 2 video cards or a dual head video card that supports dual video LUTs being loaded

Garantie Twelve (12) months from the date of sale, unless different local regulations apply. Product registration is required to receive X-Rite technical support during the warranty period. Registration can occur directly through the software, on our website, or via phone. Users are encouraged to register their product within the first 30 days of use.
Poids i1Pro device: 285 g (10.1 oz)
Composants inclus i1Pro 3 Plus spectrophotometer (measurement device), calibration plate, ambient light measurement head, monitor holder, positioning target,  scanning ruler, backer board, USB cable.  i1Profiler v3.x software for monitor profiling plus QA for monitors and printers.
Windows Windows 7, 8, 8.1, 10 (with latest Service Pack installed)
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