Model #: erx54
ERX54
Brak produktu
This instrument has been discontinued. An inline non-contact spectrophotometerfor color measurement on coated glass. The ERX54 measures the glass production of directly on production machine or in the laboratory. A spectral curve provides detailed reflectance information.
ERX54 Inline Non-Contact Spectrophotometer Makes Measuring Glass Fast, Accurate
Multiple silver layers on glass panes add functionality to architectural fronts and are state of the art in architectural design. Low-E glass or solar protection is used all over the world to reduce costs for heating or cooling houses or other structures. However, glass is a non-scattering product which makes it a challenge to measure.
With the ERX54, the glass is illuminated directly on the production machine at a 15° angle and measured at -15°. This measurement delivers the same readings as would be obtained in the laboratory with a sphere geometry measurement. If two instruments are combined, both reflectance and transmission can be measured from both sides of the pane.
When used with ESWin QC software, the ERX54 enables accurate color adjustments that improve manufacturing output and reduce waste due to color drift.
Benefits:
- Accurately measure and quantify functional layers such as low-E and solar protection for consistency and optimal functionality.
- When mounted on either side of a glass pane, measures reflectance and transmission from both sides to ensure the highest quality.
- A spectral range from 330 nm to 730 nm with 1 nm optical resolution delivers best-in-class measurement results.
- Measurement data aligns with sphere spectrophotometers used in the laboratory environment for consistency across the workflow.
- External calibration is only necessary every 4 weeks for maximum instrument uptime.
Specifications
Short Term Repeatability - White | dL*, da*, db* < 0.03 |
---|---|
Measurement Geometry | 15°/15° |
Measurement Time | flash |
Measurement Working Distance | 22mm-53mm |
Spectral Interval | 330-730 |
Spectral Range | 1nm |
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