Taking Design Virtualization to the Next Level with X-Rite Pantone’s Total Appearance Capture

Learn how the Total Appearance Capture (TAC™) can digitize designs in this free webinar.

X-Rite Pantone's industry-changing Total Appearance Capture ecosystem is an appearance measurement solution that brings a new level of accuracy and efficiency to the capture, communication and digital presentation of physical materials in the virtual world. TAC enables designers, 3D artists, material specifiers and marketers to bring their product designs to life with digital materials that have the exact same visual characteristics as their physical counterparts. TAC’s sophisticated technology reduces the need for manual adjustments to scanned materials and improves design and approval cycles.

In this pre-recorded webinar, X-Rite color experts discuss how the Total Appearance Capture ecosystem works and how this new level of material scanning accuracy can help designers bring their ideas to life. You will also hear from an Autodesk virtual design expert about TAC’s ability to transform the automotive industry’s processes for designing products and creating marketing materials.

Total Appearance Capture


About the Presenters

Tobias Rausch
Dr. Tobias Rausch
Tobias Rausch is responsible for the world-wide product and market management of X-Rite Pantone’s new Total Appearance Capture (TAC) technology. Rausch has been with X-Rite for 8 years and is based at X-Rite’s European Headquarters in Regensdorf, Switzerland. For the last 16 years he has been deeply involved in the development of color and appearance measurement solutions in different positions. He graduated in printing engineering at the Stuttgart Media University and holds a PhD from the University of Arts in London.

Marc Ellens
Dr. Marc Ellens
For more than 10 years, Marc Ellens has been involved in X-Rite Pantone’s research and development efforts, going beyond color toward the capture and reproduction of appearance. He began working at Computer Design, Inc., now part of Lectra Systemes, developing design applications for the textile industry. Ellens has presented at the Nvidia GPU Technology conference, Autodesk’s Automotive Innovation Forums, and the SPIE Electronic Imaging Conference. He is named in three patents related to material visualization and reproduction. He received his BS in Mathematics and Computer Science from Calvin College, and his PhD in Computer Aided Geometric Design from the University of Utah.


What people have said about Total Appearance Capture

"Total Appearance Capture technology has the potential to transform the automotive industry’s processes for designing products and creating marketing materials."

— Michael Russell, Autodesk

Capture. Communicate. Visualize.

Welcome to the smoothest and most accurate way to take real materials and migrate them into the digital world. Now, you can measure and model the appearance characteristics of a physical material with an entirely new level of accuracy, enabling unmatched realism and efficiency in virtual design.

Fill out the form to watch and learn more.

Taking Design Virtualization to the Next Level with X-Rite Pantone’s Total Appearance Capture

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