Model #: tac-scan
Virtual Materials with Unmatched Realism
Capturing exact appearance characteristics is critical to improving quality and speeding up time to market for products, factories, transport and infrastructure. X-Rite experts use the breakthrough TAC7 Scanner to scan physical material samples to produce highly accurate digital material definitions.
TAC7 scanning brings measurement-driven virtual materials to an unmatched level of realism for state-of-the-art design, production, supply chain and CAD infrastructures for enhanced product lifecycle management. Color, texture, gloss and other surface appearance characteristics are stored in a highly realistic, accurate and precise digital material specification in an Appearance eXchange Format (AxF) file. AxF files are stored, managed in a library function, viewed, edited and searched for in the X-Rite Pantora Digital Material Hub and can be rendered in X-Rite’s Virtual Light Booth or third-party rendering systems.
- Use the services-based approach in environments requiring scanning of a limited number samples annually to minimize the need to invest in equipment and expertise.
- Use TAC Services as an entry point to total appearance capture in a pilot approach to determine how data fits into workflows and whether it makes sense to invest in a TAC7 scanner.
- Leverage X-Rite expertise and infrastructure to capture Total Appearance data for physical samples, enabling a highly accurate virtual view that minimizes the need for the production of multiple physical mock-ups or samples.
- Deliver rapid return on investment by significantly reducing costs and cycle time associated with development and distribution of multiple physical mock-ups or samples.
You Might Also Like
TAC7 is the physical material scanner for X-Rite’s Total Appearance Capture (TAC) Ecosystem, scanning physical material samples to produce highly accurate digital material definitions.
The X-Rite Pantora Material Hub is a controlling hub for X-Rite Total Appearance Capture (TAC) Ecosystem components, connecting digital material input sources with output destinations.
News and Events
We’re pleased to announce that X-Rite will be participating as a sponsor at FEI in May, and that Ron Voigt, president of X-Rite, will be presenting on the magic of specificity.
Visit X-Rite at KeyShot RenderWorld to see a live demonstration of the Total Appearance Capture (TAC) ecosystem, an award-winning appearance measurement solution.