Model #: tac-pan

PANTORA™ Material Hub

The X-Rite Pantora Material Hub is a controlling hub for X-Rite Total Appearance Capture (TAC) Ecosystem components, connecting digital material input sources with output destinations. 

Questions?  1.800.248.9748

Browse, View and Edit Virtual Materials in Real Time

The X-Rite PANTORA™ Material Hub desktop application is designed to simplify the management of a large volume of complex color and appearance data. It acts as a controlling hub among all X-Rite Total Appearance Capture (TAC™) Ecosystem components, connecting digital material input sources with output destinations such as Virtual Light Booth, third-party rendering software and Product Lifecycle Management (PLM) Systems.


The PANTORA Material Hub includes a Material Browser to find, acquire and import digital materials directly from instruments or from local or cloud databases; a Material Viewer enabling materials to be applied to arbitrary geometry and rendered in a virtual scene; and a Material Editor that allow users to see the impact of changing gloss levels or special-effect pigment concentrations.


  • Create large textured areas from small scans using advanced quilting and synthetic algorithms in a highly automated process that allows users to quickly create virtual samples without the need for a large physical sample.
  • Quickly find, acquire and import digital material specifications in AxF™ format
  • Apply materials to arbitrary geometry, rendering them in real-time in a virtual scene for an immersive digital material evaluation experience.
  • Use multi-angle spectrophotometers like the X-Rite MA 9X family as well as image-based color capturing devices like X-Rite CAPSURE to add new data and variations in the editing process.
  • Take advantage of online editing in the CPU or GPU shader with results visible in real time in the selected scene.

The PANTORA Material Hub provides an efficient, convenient repository that makes it fast and easy to acquire, browse, import and edit digital material specifications for use in the Total Appearance Capture (TAC) Ecosystem as well as with 3D rendering and PLM systems. Combined with Virtual Light Booth, it creates a real-time immersive experience for evaluation of all types of digital materials, shortening product development cycles and improving overall product quality.


Minimum Order Quantity


3rd Party Software Supported

Autodesk VRED Professional 2016 (AxF 1.0 - BTF, SVBRDF, CPA 1.0)
Autodesk VRED Professional 2017 (AxF 1.0 1.1; 1.2 – BTF, SVBRDF, CPA 1.0 and 2.0)
Nvidia iRay 2016-2 (AxF 1.3 – SVBRDF, CPA without flakes)

Configuration Options

TAC7 or Standard

Experience Level


Import/Export Format

Materials: AxF; .ma; .vpb*
Objects: .obj
Environments: .hdr, .exr
Scenes: *requires a VRED 2016 or 2017 Professional license on the same computer

Instrument Display


Languages Supported


Software Development Kit


Software Modes

TAC7 or Basic

Supported Devices


User Experience

Wizard for measurement, Configurable for the rest

Mobile Device Compatibility


NetProfiler Support


PantoneLIVE Support




Apple iOS





Windows 7 64 bit or
Windows 10 64 bit

Available Disk Space

Min. 1 TB free space


Min. 1 Gigabit Ethernet adapter (recommended: 2 adapters, one dedicated for TAC7 communication)

Display Resolution 1080p or higher
Internet Connection

Not required


Min. 16 GB

Number of Displays Supported per Workstation


Optical Drive

Internet or usb dongle


Intel Xeon or Core i7 recommended (AMD CPUs not tested by X-Rite), min. 8 virtual cores (for example 4 physical and 2x hyperthreading) , min. 10,000 CPU Marks recommended


User must have Administrator rights to install and uninstall the application

Video Card

NVIDIA Quadro or GeForce (AMD GPUs not tested by X-Rite), min. 2 GB RAM, min. 5,000 G3D Marks recommended

Compatible Android Devices


Compatible iOS Devices


Data Format AxF

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News and Events


FEI 2017

We’re pleased to announce that X-Rite will be participating as a sponsor at FEI in May, and that Ron Voigt, president of X-Rite, will be presenting on the magic of specificity.

KeyShot RenderWorld 2017

Visit X-Rite at KeyShot RenderWorld to see a live demonstration of the Total Appearance Capture (TAC) ecosystem, an award-winning appearance measurement solution.

Questions? Need a Quote? Contact Us.  1.800.248.9748